| 摘要 |
A method and apparatus are disclosed for gaging the diameter and axis position of circularly shaped part features, such as bores, bosses, etc., consisting of an arrangement for orbiting a probe interfit with the feature to be gaged, the probe adapted to be wobble rotated while in contact with axially spaced locations on the feature. The orbital motion of a probe extension is measured to provide an indication of oversize conditions and/or an out-of-position axis. The wobbling rotation of the probe is achieved by orbital drive of a support plate which is resiliently interconnected with one or more probes to wobble each of the probes, enabling simultaneous gaging of several features. Various special arrangements are disclosed for gaging blind holes, bores of very shallow depth and male features.
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