| 摘要 |
Apparatus for probing electric circuits, such as thick layer circuits or printed circuits, comprising at least two probe tips, support arms respectively carrying the probe tips, respective program-controlled displacement units to displace the support arms so that the probe tips may assume any desired position in a plane parallel to that of the circuit to be tested, and means for displacing the support arms between a high position and a low position in which the probe tips are in contact with the circuit.
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