发明名称 Calibration test circuit for optical measurement instruments - has generator supplying phased signals and averaging circuit
摘要 <p>A circuit for automatically testing the calibration of optical measurement instruments, esp. analysis instruments, measures the attenuation of light passing along a measurement path to a photoreceiver with an electronic evaluation circuit determining the reduction in the measurement signal. The automatic test procedure is simplified and its accuracy improved. The attenuation is a result of a defined reduction of the electrical parameter influencing the indication signal which is split up into pulses for the averaged reduction. An averaging stage connected in front of the indicator has a time constant greater than the pulse interval. The lamp voltage, modulator control voltage or photoreceiver output signal may be converted into pulsed form using a test signal generator.</p>
申请公布号 DE2944213(A1) 申请公布日期 1981.05.07
申请号 DE19792944213 申请日期 1979.11.02
申请人 ERWIN SICK GMBH OPTIK-ELEKTRONIK 发明人 KRAUSE,GERHARD
分类号 G01D18/00;G01N21/27;(IPC1-7):01D18/00;01N21/59 主分类号 G01D18/00
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