发明名称 |
Calibration test circuit for optical measurement instruments - has generator supplying phased signals and averaging circuit |
摘要 |
<p>A circuit for automatically testing the calibration of optical measurement instruments, esp. analysis instruments, measures the attenuation of light passing along a measurement path to a photoreceiver with an electronic evaluation circuit determining the reduction in the measurement signal. The automatic test procedure is simplified and its accuracy improved. The attenuation is a result of a defined reduction of the electrical parameter influencing the indication signal which is split up into pulses for the averaged reduction. An averaging stage connected in front of the indicator has a time constant greater than the pulse interval. The lamp voltage, modulator control voltage or photoreceiver output signal may be converted into pulsed form using a test signal generator.</p> |
申请公布号 |
DE2944213(A1) |
申请公布日期 |
1981.05.07 |
申请号 |
DE19792944213 |
申请日期 |
1979.11.02 |
申请人 |
ERWIN SICK GMBH OPTIK-ELEKTRONIK |
发明人 |
KRAUSE,GERHARD |
分类号 |
G01D18/00;G01N21/27;(IPC1-7):01D18/00;01N21/59 |
主分类号 |
G01D18/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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