发明名称 ROTATION MEASURING METHOD FOR LIGHT PHASE AND PLANE OF POLARIZATION
摘要 PURPOSE:To lower applied voltage by a method wherein the half-wavelength voltage of a crystal as a sample is indirectly measured from a phase change which gives by the applied voltage of the crystal as the sample to the optical beams of modulation at 100% by the applied voltage of a crystal, which is easily modulated, except the crystal as the sample. CONSTITUTION:Laser rays from a laser light source L pass through a polarizer P, pass through a crystal M in substance, which has a great Pockels effect, such as lithium tantalate (LiTaO3) or lithium niobate (LiNbO3) or the like, and is branched by means of a beam splitter BS. Modulation at 100% is previously provided to passing light easily by applying voltage to the crystal M, whose half-wavelength voltage value is small, here, voltage, which largely differs from the applied voltage of the crystal M and has frequency which is easily discriminated, is slightly applied to a crystal S as a sample, a phase change of the light of modulation at 100% generated by application of the voltage is detected, and a half-wavelength is measured from the applied value and the quantity on the change.
申请公布号 JPS5647723(A) 申请公布日期 1981.04.30
申请号 JP19790123193 申请日期 1979.09.27
申请人 JAPAN BROADCASTING CORP 发明人 TAKIZAWA KUNIHARU
分类号 G01J4/04;(IPC1-7):01J4/04 主分类号 G01J4/04
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