发明名称 CIRCUIT QUALITY TEST SYSTEM
摘要 <p>PURPOSE:To enhance the multiplexing degree to make the circuit quality test possible, by giving a circuit quality measuring function to the line concentrator which causes one bit of the character, which is transmitted or received by individual circuits, to correspond to one bit of multiple circuits. CONSTITUTION:In case that the circuit quality in the transmission side of individual circuits 6 is tested, exchange 1 requests circuit quality test execusion of transmission circuit to line concentrator 3 through special line concentrator 2 of individual circuits 5 and multiple circuits 7. Line concentrator 3 transmits test data with the distortion rate added to one line out of individual circuits 6 designated by exchange 1. Other-party exchange 4 analyzes data to check whether test data is received correctly or not, thereby measuring the circuit quality.</p>
申请公布号 JPS5644235(A) 申请公布日期 1981.04.23
申请号 JP19790120398 申请日期 1979.09.19
申请人 NIPPON ELECTRIC CO 发明人 YUI TAKAYUKI
分类号 H04M3/32;H04B3/46;H04J3/14 主分类号 H04M3/32
代理机构 代理人
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