发明名称 ETCHING DEVICE
摘要 PURPOSE:To prevent contamination from electrode metal and to maintain uniformity of etching by a method wherein a dielectric material layer where a substance to be etched is placed is formed on one of electrode of a plasma-etching device and air vents are provided on interfaces of electrodes and a dielectric layer. CONSTITUTION:A laying place of a substance to be etched 11 (underneath of which an organic material 12 such as polyester film or the like is provided) is formed by providing a high molecular material layer 9 such as tetrafluoro-ethylene resin or the like on a metal electrode 8, and an air vent 10 which is leading to a vacuum container of the device is provided. As a result, contaimination coming from the metal of the material to be etched 11 is eliminated, the gas emitted by organic substance is discharged, the material on which an etching is performed is tightly fixed and a stabilized uniformity of etching can be maintained.
申请公布号 JPS5643726(A) 申请公布日期 1981.04.22
申请号 JP19790119222 申请日期 1979.09.19
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 OKANO HARUO;HORIIKE YASUHIRO
分类号 H01L21/302;H01L21/3065;(IPC1-7):01L21/302 主分类号 H01L21/302
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