发明名称 Fabrication of integrated circuits employing only ion implantation for all dopant layers
摘要 This disclosure relates to a method of fabricating an integrated circuit wherein all dopant layers are formed by ion implantation. More specifically, the buried collector of a bipolar integrated circuit is formed by ion implantation which collector has a high density of dopant species and is formed relatively deep into the substrate on which the circuit is formed. In addition, in order to reduce the number of steps employed in the fabrication, certain of the implanted species can be activated during the same high temperature annealing step. A pre-aligned mask is employed for the formation of the base contact, collector contact, and emitters, which mask can be selectively opened with a reduced number of masking steps. With such a mask, the base contact, collector contact and emittor are self-aligned even though formed at different steps in the process.
申请公布号 US4261763(A) 申请公布日期 1981.04.14
申请号 US19790080618 申请日期 1979.10.01
申请人 BURROUGHS CORPORATION 发明人 KUMAR, RAKESH;HUNT, MERRILL
分类号 H01L21/033;H01L21/265;H01L21/331;H01L21/74;(IPC1-7):H01L21/26;H01L27/04 主分类号 H01L21/033
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