发明名称 MEASURING METHOD FOR ION DENSITY BY FLUORESCENT XXRAYS
摘要 PURPOSE:To measure rapidly and correctly each ion density in the solution in which two kinds of ion are mixed by using a combined relation of the strength of an X-ray and the ion density prepared by adopting the other ion density as a parameter. CONSTITUTION:In measurement of the solution containing Ni<2+> and Zn<2+>, for instance, a relation chart (a) is found by measuring the strength of NiKalpha rays of standard liquids whose Ni<2+> density is 0, 20, 40, 60, 80 and 100, respectively, by using the density of Zn<2+> (g/l) as a parameter, while another relation chart (b) being found under the similar conditions except for replacement of Ni<2+> with Zn<2+>. Next, a sample to be tested is measured, and, the strength of NiKalpha rays obtained being applied to the chart (a), the density of Ni<2+> (X1-X6) when the density of Zn<2+> has each of valued 0-100 is found. Then, this is indicated as a relation Y1 between Ni<2+> and Zn<2+> density, while a similar relation Y2 is indicated by using the strength of ZnKalpha rays, and an intersecting point O of Y1 and Y2 is found, thereby the density of each ion is determined (chart c).
申请公布号 JPS5636044(A) 申请公布日期 1981.04.09
申请号 JP19790112184 申请日期 1979.08.31
申请人 SUMITOMO METAL IND 发明人 FUJINO MASAKATSU;MATSUMOTO YOSHIROU
分类号 G01N23/223;(IPC1-7):01N23/223 主分类号 G01N23/223
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