发明名称 VERFAHREN UND EINRICHTUNG ZUM GRAVIEREN INTEGRIERTER SCHALTUNGEN
摘要 Apparatus for dry chemical etching caused by ion bombardment of a substrate placed in a vacuum chamber. The substrate is in contact with an electrode, connected to a high frequency bias voltage source having one terminal connected to a ground of the chamber. The etchants are produced in the form of plasma by an electrical discharge maintained in the chamber containing a gas or a suitable gaseous mixture. The plasma is produced by a microwave generator and the bias voltage by means of a high frequency source. The respective amplitudes and frequencies of the two sources enable the base of a groove on an electronic circuit to be etched without erosion of the groove.
申请公布号 DE3031220(A1) 申请公布日期 1981.03.26
申请号 DE19803031220 申请日期 1980.08.19
申请人 OFFICE NATIONAL D'ETUDES ET DE RECHERCHES AEROSPATIALES,O.N.E.R.A. 发明人 TAILLET,JOSEPH
分类号 H01L21/302;H01J37/32;H01L21/26;H01L21/3065;H05H1/24 主分类号 H01L21/302
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