Bit testing system for data correction - has switching system along parallel lines, positioned according to selected correction code

摘要

The bit testing system-for data correction according to a selected correction code, for data words with parallel bits in a storage medium-has a oair of testing lines for each bit generated. Different potentials are applied at their input ends, and along them are switching systems at crossing and non-crossing points. These are arranged according to the algorithm of the code selected. They esnure that a data bit with a logical value of 0 has an uninterrupted passage along the lines and that a data bit with a valve of 1 operates a crossing point. At the output ends is an evaluation circuit with an outout dependent on the potential difference correps. to the logical valve of the bits.