| 摘要 |
An automated sequential test system, designed to compare analog test signals, derived from plurality of test nodes, located on the circuit under test with the corresponding reference signals, derived from plurality of similar nodes, located on a pre-tested good reference circuit, is described. The test system generates 'pass signals' for such test nodes, the signal levels compared to lie between the pre-assigned positive and negative tolerance limits of the signal levels on the corresponding reference nodes. Otherwise, the system exhibits a fail signal, digital display count of the node number and polarity of failure from the reference signal in its tolerance band for such nodes which do not pass the test limit. These test capabilities incorporate static and dynamic signal testing and signal frequency comparison, capability to connect a node with an external source, sink or instrument, option to program any tolerance limit on a reference signal, option to monitor all test and reference signals on the same monitor terminal, power-on reset, automatic reset at the end of the system test cycle and capability to hold and skip a typical node for test purposes.
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