发明名称 POLYIMIDE PATTERN FORMING METHOD
摘要 PURPOSE:To remove perfectly a residual film resulting from development inclined to remain on nondeveloped areas, by processing with an etching agent a polyimide pattern obtained by heating a patternized polyimide precursor in thin film. CONSTITUTION:A film of a photosensitive polyimide precursor containing a photosensitive group, such as a vinyl or acrylic group, and a photosensitive compound, such as bichromate or quinonediazide is provided on a substrate, such as a aluminum plate, this film is patternwise exposed to light, and developed to remove the nonexposed areas, then it is heat-processed to convert said precursor pattern into a polyimide pattern. The obtained polyimide pattern is etched to perfectly remove a residual film resulting from development. As this etching agent, hydrazine alone or mixed with ethylene diamine is preferable, and this etching is carried out to an extent of approximate 1/5 film thickness reduction.
申请公布号 JPS5622428(A) 申请公布日期 1981.03.03
申请号 JP19790097258 申请日期 1979.08.01
申请人 TORAY INDUSTRIES 发明人 HIRAMOTO TOSHI;EGUCHI MASUICHI
分类号 G03F7/004;G03F7/038;H01L21/027 主分类号 G03F7/004
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