发明名称 SELF DIAGNOSTIC SYSTEM
摘要 PURPOSE:To enable to check easily where the production of failure is caused, if a failure is taken place, by requesting the loading of program to other unit only when the unit is normal, through the test of the unit. CONSTITUTION:According to the program loading condition, the ROS selection signal generating circuit 4 produces the selection signal. Further, the ROS selection control circuit 3 judges the selection signal and for example, if it is judged as the signal requiring test, the self diagnostic test ROS5-1-5-n are sequentially selected, the test program is loaded to the main memory unit 2, and the test is executed. Further, all the tests are normally finished, the boot strap of the ROS6 for program loading is loaded to the main memory unit 2. Then, the boot strap is executed and the program loading request is made to the host computer 7.
申请公布号 JPS5621252(A) 申请公布日期 1981.02.27
申请号 JP19790096601 申请日期 1979.07.28
申请人 FUJITSU LTD 发明人 KUGIMIYA SETSUO;HANADA AKIO
分类号 G06F11/22;G06F9/445;G06F13/00 主分类号 G06F11/22
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