发明名称 Automatic light refraction meter using deflection principle - for process control or chromatographic analysis
摘要 <p>The refraction meter has an optical system comprising an illumination system (1..7), a differential cuvette (8) with prismatic spaces for the sample and a reference fluid and an imaging system (10..14) with photo detectors. The parallel light beam obtained from the illumination system (1..7) is chopped by a rotating disc (9) having spaced segment shaped lenses for periodic deflection of the beam, to obtain alternating signals from the photodetector (14) corresp. to the refractions of the sample and the reference fluid. The disc (9) is positioned after the differential cuvette (8) and is followed by a lens (10) and a shutter (11) with a stop edge perpendicular to the deflection direction.</p>
申请公布号 DE3028564(A1) 申请公布日期 1981.02.19
申请号 DE19803028564 申请日期 1980.07.28
申请人 JENOPTIK JENA GMBH 发明人 EISENHUT,PETER,DIPL.-ING.;GODAT,ROLF,DIPL.-PHYS.;NEBE,WOLFGANG,DIPL.-PHYS.DR.;SCHMIDT,GOTTFRIED,DIPL.-ING.DR.
分类号 G01N21/41;(IPC1-7):G01N21/41 主分类号 G01N21/41
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