| 摘要 |
An inspection circuit for use in an electronic timepiece is provided. The inspection circuit is characterized by the use of a gating circuit intermediate the timekeeping circuit of an electronic timepiece and certain counters that apply timekeeping signals to the digital display digits. The gating circuit is adapted to be selectively disposed into an inspection mode and thereby simultaneously apply to certain of the counters producing timekeeping signals a predetermined frequency inspection signal thereby reducing the time required to inspect the performance of the timepiece.
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