发明名称 ELECTRIC FIELD ELIMINATION ION SOURCE
摘要 PURPOSE:To improve the operability of an ion source, by providing a window, through which the interior of a vacuum vessel can be observed, on the extension of opposite direction of a microneedle to an electrode at a face-to-face position to the microneedle. CONSTITUTION:On a microneedle 3 mounted to the point end of an emitter 2, a sample is applied. Between the microneedle 3 and an electrode 4, located at a face- to-face position to the microneedle 3, a voltage of about 8kV is applied. At this time, the position of the microneedle 3 can be observed through a repeller 7, observing hole 10 and observing window 9. If the position of the microneedle 3 is visually aligned to the center of the electrode 4, at a face-to-face position to the microneedle, the ion applied onto the microneedle 3 can be fed into the center axis of a mass spectrometer after an elimination of ion.
申请公布号 JPS5611844(A) 申请公布日期 1981.02.05
申请号 JP19790085965 申请日期 1979.07.09
申请人 HITACHI LTD 发明人 HIROSE HIROSHI
分类号 H01J49/04;G01N27/62;H01J49/16 主分类号 H01J49/04
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