发明名称 ANALYTICAL APPARATUS FOR GAS COMPONENT
摘要 PURPOSE:To eliminate the need for any infraredray light sorce and measure gas components accurately by making use of the infrared rays produced from the surface of an object which assumes a high-temp. state when heated by a heat source. CONSTITUTION:When the wall of a furnace 10 through receiving the energy of a heat source assumes a high-temp. state, infrared rays are emitted from this wall. The infrared rays transmit through the inside of the gaseous atmosphere in the furnace and are supplied to a detector 12 through a through-window 11. The detector 12 extracts the infrared light of the wavelength lambda1 to be measured and the infrared light of the wavelength lambda2 adjacent thereto thence it converts these respectively to electric signal, and inputs the same into a measuring device 13. Thence, the device 13 arithmetically processes both input signals and calculates the gaseous components of the wavelength lambda1. In this way, the need for any infrared ray light source and sampler or the like is eliminated and the gaseous components are measured accurately.
申请公布号 JPS56147045(A) 申请公布日期 1981.11.14
申请号 JP19800050427 申请日期 1980.04.18
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 INOUE YUUICHIROU
分类号 G01N21/35;G01N21/3504;(IPC1-7):01N21/35 主分类号 G01N21/35
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