首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD OF INSPECTING METAL MICROSTRUCTURE WITH OPTICAL MEANS
摘要
申请公布号
SU1476342(A1)
申请公布日期
1989.04.30
申请号
SU19864127925
申请日期
1986.10.04
申请人
VATNIK LEONID E,SU;KRISTAL VIKTOR G,SU;RABINOVICH EMMA,SU
发明人
VATNIK LEONID E,SU;KRISTAL VIKTOR G,SU;RABINOVICH EMMA I,SU
分类号
G01N1/32
主分类号
G01N1/32
代理机构
代理人
主权项
地址
您可能感兴趣的专利
System for selectively combining satellite signals sent to a user through an optical fiber
Method of controlling movement of a transducer and disk drive using same
Data-driven and plug-in defined event engine
Maintaining data integrity for extended drop outs across high-speed serial links
Method and circuit for updating a software register in semiconductor memory device
Cassette and method for fabricating liquid crystal display device using the same
Hearing aid with a control element
Slim profile telecommunications connection apparatus
Method and apparatus for supporting asymmetric multi-threading in a computer system
Process for preparing unsymmetrical biaryls and alkylated aromatic compounds from arylnitriles
GaN based digital controlled broadband MMIC power amplifier
Convertible vehicle
Image processing system and method for processing image data using the system
Load balancing in wireless communication network
Set of buttons for a handset
Method and apparatus for facilitating an adaptive electronic design automation tool
Cryptosystem for data security
Isolated soluble corticotropin releasing factor receptor type 2 (sCRFR2)
Copy protection method and system for digital media
Rotation-angle detecting apparatus