| 摘要 |
PURPOSE:To realize an extremely quick and high-accuracy measurement for the texture of the metal rolled plate, by irradiating the continuous X-rays to the test sample and then detecting for counting the diffraction X-ray sent from the sample through the semiconductor detector fixed at the constant diffraction angle position. CONSTITUTION:The continuous X-rays generated from the X-ray tube are changed into the parallel beams through the incident solar slit, and the parallel component is put in directly in a plate form and with an angle secured. The X-ray having the specific energy among those components reaches the semiconductor detector located at the position symmetrical to the X-ray source and against the sample normal line in the form of the diffracted line on the (hkl) face. Here the X-rays amplified after converted into the electric pulse are analyzed by the multiple waveheight analyzer for selection of the waveheight level of the pulse. And then the energy analysis process is given to these waveheight levels, and these data are multi-integrated to the memory region correspoonding to each waveheight level. The CPU eliminates the background after the A/D conversion to secure the correspondence of the data to the random sample diffraction X-ray intensity within the memory and through the waveform number process. Thus the axial density distribution can be obtained through a simple method. |
