发明名称 AUTOMATIC ASTIGMATISM COMPENSATION AND FOCUSSING IN SCANNING ELECTRON MICROSCOPE
摘要 PURPOSE:To simultaneously and automatically perform astigmatism compensation and focussing by scanning samples under three conditions in which one value of three parameters is different, truncating the maximum condition of the measured value to be obtained, and repeatedly scanning them under new conditions. CONSTITUTION:A computer arbitrarily selects points P1-P3 on plane I1, I2 subsequently supplies current to an astigmatism compensation coil by a combination of I11, I21, I12, I22, I13, and I23, respectively, and read to store the signals from measured circuits. Then the computer compares these signal values and classify them into three: high, intermediate, and low. Firstly, it starts with completely arbitrary three points, truncates the lowest P1, detects one new trial point, forms the three points including the new trial point, also truncates the lowest point, and detects the other new trial point. By repeating this, convergence is slowly enabled to Zenith V0 and astigmatism compensation and focussing are simultaneously enabled.
申请公布号 JPS567341(A) 申请公布日期 1981.01.26
申请号 JP19790082461 申请日期 1979.06.29
申请人 NIPPON ELECTRON OPTICS LAB 发明人 KATAKI FUMIO;HIGUCHI KEIICHIROU
分类号 H01J37/153;H01J37/21 主分类号 H01J37/153
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