发明名称 SURFACE POLLUTION MONITOR
摘要 <p>PURPOSE:To monitor a surface pollution in a non-contact manner by employing a superconductive quantum interferometer only sensitive to beta rays as detector. CONSTITUTION:While a drum 2 is lifted in a direction 5 and rotated in a direction 6 with a lift/rotator 4, a superconductive quantum interferometer 100 detects betarays released from the surface of the drum 2 to count them a measuring time predetermined by a counter 7. An output of the counter 7 is inputted into a surface pollution decision device 8, which compares the output with a reference value for judging the presence of a surface pollution and the results are outputted from an output unit 9. The interferometer 100 is not sensitive to X rays and gamma rays released from the drum 2, thereby enabling non-contact monitoring of the surface pollution alone.</p>
申请公布号 JPH01116481(A) 申请公布日期 1989.05.09
申请号 JP19870273024 申请日期 1987.10.30
申请人 HITACHI LTD 发明人 KAWASAKI SATOSHI
分类号 G01T1/16;G01T1/169;G01V5/00 主分类号 G01T1/16
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