发明名称 TEST CIRCUIT
摘要 PURPOSE:To automatically evaluate a device by comparing the level of an output signal from a device to be measured with that of a reference signal, and judging the quality of the device with reference to the result of the comparison. CONSTITUTION:An output from a test signal source 2 is applied to a device 1 to be measured, and an output from the device 1 to attenuators 4a-4n through BPF 3a-3n. A control signal generating circuit 5 is adapted to apply an instruction signal for an attenuation amount to each of the attenuators serially with respect to time in accordance with a program. As a result, the level of a required output from each of the attenuators is compared 7a-7n with that of a reference signal. When a signal representative of level agreement in output, an output representative of ''acceptable quality'' is obtained through an AND-circuit 8. Accordingly, when the pattern of a cumulative frequency spectrum is in agreement with a desired pattern thereof, the device being measured can be rated as ''acceptable''.
申请公布号 JPS564063(A) 申请公布日期 1981.01.16
申请号 JP19790079885 申请日期 1979.06.22
申请人 发明人
分类号 G01R23/165;G01R27/28;G01R31/00;G01R31/28;G05B23/02 主分类号 G01R23/165
代理机构 代理人
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