| 摘要 |
<p>IMPROVED SEMICONDUCTOR TESTER An apparatus for testing the operating state of single and multiple semiconductor junctions, either in or out of circuit. The tester lncludes a testing circuit which in turn includes a transformer having a secondary with plurality of voltage tap leads which are selectively connectable by a switching device to a resistance and voltage divider array, which includes means adapted to receive the junction to be tested. The output of the testing circuit is applied to a display circuit which includes a visual indicator, which in turn produces a trace having a configuration representative of the forward and reverse characteristics of the function for inspection by an operator. The variety of voltages available at the secondary of the transformer and the variety of resistance and voltage divider combinations available permit the safe testing of a wide variety of junctions, including multiple junction.</p> |
