MEASURING METHOD USING X-RAY MICROANALYSER,申请号JP19880153328-传众专利搜索

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发明名称	MEASURING METHOD USING X-RAY MICROANALYSER
摘要
申请公布号	JPH01320749(A)	申请公布日期	1989.12.26
申请号	JP19880153328	申请日期	1988.06.21
申请人	JEOL LTD	发明人	TAJIMA HIROSHI;YOSHIDA KOJI
分类号	H01J37/244;H01J37/252	主分类号	H01J37/244
代理机构		代理人
主权项
地址

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