发明名称 Semiconductor device having bump terminal electrodes
摘要 A semiconductor structure in which metallic connecting leads are bonded to bump terminal electrodes by thermal pressure bonding. A stress mitigation layer is advantageously provided in the semiconductor structure which prevents or reduces breaking of the semiconductor substrate or an insulating film when thermal pressure bonding is applied to the bump terminal electrode.
申请公布号 US4244002(A) 申请公布日期 1981.01.06
申请号 US19780952543 申请日期 1978.10.18
申请人 NIPPON ELECTRIC CO., LTD. 发明人 SATO, SUSUMU;TSUNEMITSU, HIDEO
分类号 H01L21/60;H01L23/485;(IPC1-7):H01L23/48 主分类号 H01L21/60
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