发明名称 ADJUSTMENT OF PATTERN CROSS SECTION
摘要 PURPOSE:To make a layer to be etched so thick that lift-off method may be applied on it by a method wherein when patterning with a positive type photoresist is performed, concentration of developig solution is so varied that an angle which is formed between a substrate and a photo resist film is made to be a specified value. CONSTITUTION:A metal film 8 which comprises of two layers of chromium and chromium oxide and has reflectivity of 20% or below is formed on a glass substrate 7. Next by a positive type resist being applied in thickness of 0.4mum a resist film 9 is formed, and it is printed by close contact with a photo mask 10. Development is preformed with developing solution which is diluted by mixing with pure water to be 50% solution. By this method a resist pattern which has an angle of 80 deg. formed between the substrate and the side of the resist film is built. Next an Al- layer 11 which is 2,000Angstrom thick is applied on it, and lift off process is applied dipping in aceton, and the Al film over the resist 9 is removed. By this method an uneven evaporated metal pattern of width 0.8mum which corresponds the resist pattern can be built.
申请公布号 JPS55166922(A) 申请公布日期 1980.12.26
申请号 JP19790075322 申请日期 1979.06.14
申请人 MITSUBISHI ELECTRIC CORP 发明人 ENDOU ATSUSHI;YADA TOSHIO
分类号 H01L21/30;G03F7/30;H01L21/027;H01L21/306;H03H3/08 主分类号 H01L21/30
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