发明名称 ELECTRON BEAM EXPOSURE DEVICE
摘要 PURPOSE:To enable drawing of a slant line with excellent outlines in addition to a vertical and a horizontal lines by giving a uniform irradiation of the electron beam of an electron gun on the aperture plate having an octagonal or a hexagonal opening over the surface of a sample. CONSTITUTION:An electron beam is radiated from an electron gun 2 and a uniform irradiation of the electron beam is projected on an aperture plate 6. A pattern is drawn on the surface of a sample 12 with electron lenses 4a-4d. In this instance, a plate with an octagonal or a hexagonal opening is used as an aperture plate. Hence, an excellent slant line can be drawn in addition to a vertical and a horizontal lines.
申请公布号 JPS55163840(A) 申请公布日期 1980.12.20
申请号 JP19790070991 申请日期 1979.06.06
申请人 FUJITSU LTD 发明人 INAGAKI YUUSHI;OKABE MASAHIRO
分类号 H01L21/027;H01J37/09;H01J37/317;(IPC1-7):01L21/30 主分类号 H01L21/027
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