发明名称 |
ELECTRON BEAM EXPOSURE DEVICE |
摘要 |
PURPOSE:To enable drawing of a slant line with excellent outlines in addition to a vertical and a horizontal lines by giving a uniform irradiation of the electron beam of an electron gun on the aperture plate having an octagonal or a hexagonal opening over the surface of a sample. CONSTITUTION:An electron beam is radiated from an electron gun 2 and a uniform irradiation of the electron beam is projected on an aperture plate 6. A pattern is drawn on the surface of a sample 12 with electron lenses 4a-4d. In this instance, a plate with an octagonal or a hexagonal opening is used as an aperture plate. Hence, an excellent slant line can be drawn in addition to a vertical and a horizontal lines. |
申请公布号 |
JPS55163840(A) |
申请公布日期 |
1980.12.20 |
申请号 |
JP19790070991 |
申请日期 |
1979.06.06 |
申请人 |
FUJITSU LTD |
发明人 |
INAGAKI YUUSHI;OKABE MASAHIRO |
分类号 |
H01L21/027;H01J37/09;H01J37/317;(IPC1-7):01L21/30 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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