发明名称 PLATE FOR ELECTRON BEAM EXPOSURE
摘要 PURPOSE:To reduce a back-scattering by using a plate with an impurity ion-injected metal film. CONSTITUTION:An impurity ion (boron) injected thin metal film 22 is formed on a glass substrate 11 of an electron beam exposure plate 20 and on which an electron beam resist 13 is applied.
申请公布号 JPS55163844(A) 申请公布日期 1980.12.20
申请号 JP19790072939 申请日期 1979.06.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 TANAKA KAZUHIRO
分类号 H01L21/027;G03F7/09;(IPC1-7):01L21/30 主分类号 H01L21/027
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