发明名称 Method of making fiber probe devices using patterned reactive ion etching
摘要 A fiber probe is formed from a cladded optical fiber segment by isotropically etching a lower portion of the fiber segment, followed by cleaving the resulting etched lower portion. The resulting cleaved endface of the fiber segment is then coated with a protective layer which is then patterned by exposure to optical radiation propagating down the core of the fiber segment followed by development. A plasma etching, masked by the thus patterned protective layer, removes a desired height of cladding in the neighborhood of the cleaved endface. Finally, the lower regions of the fiber segment are subjected to a further etching to reduce the width of the tip to a desired value.
申请公布号 US5395741(A) 申请公布日期 1995.03.07
申请号 US19930173292 申请日期 1993.12.22
申请人 AT&T CORP. 发明人 MARCHMAN, HERSCHEL M.
分类号 G01N37/00;C03C25/68;C23F4/00;G02B6/02;G02B6/245;G02B6/36;(IPC1-7):C03C25/06 主分类号 G01N37/00
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