发明名称 TEMPERATURE-COMPENSATED ANALOG VOLTAGE MEMORY DEVICE
摘要 <p>In an analog voltage memory device of the type wherein a gate of a MOS field-effect transistor is connected to one terminal of analog switching means and to one terminal of a nonpolarized capacitor with the other terminal grounded, whereby a DC analog input voltage may be held as a source follower voltage of MOS field-effect transistor, adverse effects on the operation due to the variation in ambient temperature are eliminated by a constant current circuit including a NPN transistor. Variation in output due to the variation in ambient temperature may be minimized independently of ddrain current of MOS field-effect transistor, and drifts due to variation in ambient temperature of equipment and instruments such as pollution detectors and recorders which are installed outdoors may be reduced to a minimum. This analog voltage memory device is used as peak hold memory, sample-and-hold memory, zero-point memory, etc. and can well hold signals for a long time to achieve a nonvolatile memory in spite of no power supply.</p>
申请公布号 CA1091807(A) 申请公布日期 1980.12.16
申请号 CA19760267133 申请日期 1976.12.03
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 MINAMI, SHUNJI
分类号 G11C7/04;G11C27/02;(IPC1-7):11C11/40 主分类号 G11C7/04
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