发明名称 MASK
摘要 PURPOSE:To obtain a mask with a minute pattern by a method wherein a monocrystal grown on a transparent substrate is used as a light shielding film mounted onto the substrate when electron beams are selectively irradiated onto the light shielding film, while its one portion is removed and the mask is formed. CONSTITUTION:A thin Si monocrystal layer 7 with approximate 0.5-2.0mum thickness is grown on a transparent substrate 6, such as sapphire, etc. in a gaseous phase shape, and a negative type resist-film 8 is applied on the whole surface. Electron beams 9 are irradiated drawing a pattern on a region where the pattern is to be formed, polymer bridges are generated to the film 8, and the necessary pattern is formed. The film 8 is developed, the film is used as a mask, an exposing portion of the layer 7 is removed by means of etching by employing fluoric acid, etc. the film 8 is removed, and a mask 10 with the desired pattern is formed. Thus, the number of electrons dispersion to the rear from the layer 7 when irradiating the electron beams 9 may be few, and the minute pattern can be prepared.
申请公布号 JPS55158635(A) 申请公布日期 1980.12.10
申请号 JP19790066189 申请日期 1979.05.30
申请人 CHO LSI GIJUTSU KENKYU KUMIAI 发明人 MIZUNO FUMIO
分类号 H01L21/027 主分类号 H01L21/027
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