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发明名称
SEMICONDUCTOR MEMORY AND DISCRIMINATING METHOD FOR DEFECTIVE CUTTING OFF OF FUSE IN SEMICONDUCTOR MEMORY
摘要
申请公布号
JPH11203888(A)
申请公布日期
1999.07.30
申请号
JP19980006396
申请日期
1998.01.16
申请人
MITSUBISHI ELECTRIC CORP
发明人
IKEDA ISATO
分类号
G11C11/401;G11C29/00;G11C29/04;H01L21/82;(IPC1-7):G11C29/00
主分类号
G11C11/401
代理机构
代理人
主权项
地址
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