发明名称 |
METHOD FOR FABRICATING CAPACITOR OF FERROELECTRIC RAM |
摘要 |
PURPOSE: A method for fabricating a capacitor of a ferroelectric RAM is provided to improve adhesive property with an electrode material by oxidizing a surface of a Ti film at an oxygen atmosphere during a short time by use of RTP. CONSTITUTION: In a method for fabricating a capacitor of a ferroelectric RAM, an interlayerfilm(23) is formed on a semiconductor substrate in which a predetermined lower structure is formed. A first adhesive layer(25) is formed on the interlayer film, and then a first RTP process is performed. A thin film(27) for a lower electrode and a dielectric film(29) are formed on the first adhesive layer. The dielectric film, the thin film and the first adhesive layer are patterned by use of a mask for a lower electrode. A capping oxidation film(31) and a second adhesive layer(33) are sequentially formed over the resultant structure, and then a second RTP process is performed. After forming an upper electrode(35) connected to a contact for the upper electrode, a third adhesive layer(37) is formed on a surface of the upper electrode and a third RTP process is performed.
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申请公布号 |
KR20000025681(A) |
申请公布日期 |
2000.05.06 |
申请号 |
KR19980042844 |
申请日期 |
1998.10.13 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD. |
发明人 |
KWON, SUN YONG;SEON, HO JUNG |
分类号 |
H01L27/10;(IPC1-7):H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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