发明名称 |
MANUFACTURE OF GALLIUM ARSENIDE SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To improve initial characteristic by washing GaAs with water into which N2 gas is being injected. CONSTITUTION:When a GaAs device is washed with deionized water on oxidized region 6 is formed on a GaAs active layer 2. A depletion layer is widened and an active layer is made to be narrower in this region 6 in case of a FET and initial characteristic is deteriorated. Such deterioration is remarkable when a partial metal electrode such as a gate electrode exists. When dissolved O2 in water is small, progress of oxidation becomes excessively slow. Therefore with N2 gas injected into water dissolved O2 gas is eliminated, and a GaAs device with extremely excellent initial characteristic is obtained. |
申请公布号 |
JPS55153337(A) |
申请公布日期 |
1980.11.29 |
申请号 |
JP19790061831 |
申请日期 |
1979.05.18 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
HAGIO MASAHIRO;NANBU SHIYUUTAROU;SHINAGAWA MUTSUAKI |
分类号 |
H01L21/308;H01L21/304;H01L21/306;(IPC1-7):01L21/304 |
主分类号 |
H01L21/308 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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