| 摘要 |
PURPOSE:To enable performance of an individual test with a measuring probe touched to a pad when testing two circuits connected in parallel by providing an individual input terminal pad for each circuit and also by connecting output terminals collectively. CONSTITUTION:For the two parallel circuits required to test individually, the input and output terminals are composed of as follows. When No.1, as A circuit, and No.2 as B circuit, are provided on a semiconductor substrate 3, input pard 4 and 4' are provided independently, and they are connected to circuits 1 and 2 with wirings 5 and 5' respectively. Also the output terminals are combined in one using wirings 6 and 6' and are connected to the other circuit not illustrated in the diagram with a wiring 7. When the circuits 1 and 2 are going to be tested individually after they have been composed as above, measuring probes 10 and 10' are put on the pads 4 and 4' respectively, and the prescribed test is performed individually. |
