| 摘要 |
<p>A universe of probes (47) is contained within a platen (14) in a spaced-apart, substantially parallel relationship with one another with their tips (44) pointing in the same direction. Each probe is free to move longitudinally between an advanced or test position and a retracted position. The platen (14) nests into a wired personalizer (12) having probe selector posts (24) upstanding therein in a pattern corresponding to the pattern of test points on a circuit board (18) to be tested. These posts (24) serve to push up or advance the probes (47) needed to test a particular type of circuit board. The posts are conductive and each is individually connected to the test system. The circuit board (18) to be tested rests on a special deformable gasket (54) so that its test points (19) are suspended over and aligned with the advanced test probes (47). When the fixture is evacuated, the circuit board (18) to be tested is drawn downwardly so that the test points (19) on the board make electrical contact with the tips (44) of the advanced probes (47). </p> |
