| 摘要 |
<p>Apparatus and methods used to obtain image information from modulation of a uniform flux. An exposure measuring apparatus is disclosed which comprises a multilayered detector structure (10) having an external circuit (12, 22) connected to a transparent insulating layer (18) and to a conductive plate (14), a radiation source adapted to irradiate the detector structure (10) with radiation capable of producing electron-hole pairs in a photoconductive layer (16) of the detector (10) wherein the flow of current within the external circuit (12, 22) is measured when the detector is irradiated by the radiation source. </p> |
