| 摘要 |
PROBLEM TO BE SOLVED: To provide a means which makes DRAM usable as an inside test memory of non-volatile memory tester. SOLUTION: Various functions which is expected by the inside test memory (128) in a memory tester (1) is operated by the memory set (73-76). At each memory set, the address selective mechanism (77-79, 130) is strengthened (131a-z). When corresponding test part is operated under control of test program, the address selective management is changed dynamically and automatically. Then, the result of Tag RAM (or ECR or buffer memory) is send to the proper position inside the memory set. On fixed kind of tests, a part of the inside test memory is used as stimulative Log RAM which moves as an ideal DUT, and after the test, an aptitude condition which is to exist at actual DUT is generated. As a result, the actual part is put under the test, and expected receiving vector is read out from the stimulative Log RAM. The compared result is send to ECR, Tag RAM, or, etc., as usual.
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