| 摘要 |
A method and apparatus are disclosed for identifying and locating faults in the portion of circuit assemblies containing digital signals by conducting in-circuit tests embodying the application of uninterrupted sequences of signals to nodes of the circuits and the comparison of nodal signals to expected values, reducing the complex testing of the circuit assemblies to a series of simple tests of components or groups of components constituting the assemblies; and, in connection with bus-structured circuits, eliminating the possibility of bus contention problems in good circuit assemblies under test. |
