发明名称 TEST UNIT FOR INFORMATION PROCESSOR
摘要 PURPOSE:To ensure checking of the processor by selecting the data given from the main memory and the memory access control part in case the arithmetic control unit is under the normal state and under the test state respectively and then sending the selected data to the arithmetic control part. CONSTITUTION:State control circuit 4 identifies whether the arithmetic control unit is under the normal state or under the test state, and then sends the result of identification to test unit 3 via signal 6. And the access request is given to main memory 5 from memory access control part 2 through unit 3 under the normal state; while the access request sent from part 2 is replaced to the access to be given to register 11 within unit 3 under the test state respectively. In case the further reading request occurs to memory 5, selector 12 selects the data given from memory 5 under the normal state and then selects the data given from part 2 under the test state each to then send the selected data to the arithmetic control unit. In this way, the checking can be given to the function of processor 1 which gives the access to memory 5.
申请公布号 JPS55150047(A) 申请公布日期 1980.11.21
申请号 JP19790057247 申请日期 1979.05.10
申请人 NIPPON ELECTRIC CO 发明人 OOKITA AKIRA
分类号 G06F12/16;G06F11/00;G06F11/22;G11C29/00 主分类号 G06F12/16
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