发明名称 METHOD OF PATTERN FORMATION
摘要 PURPOSE:To prevent the deterioration of a substrate in improving the sensitivity of a positive-type radiation-responsive resist with a crosslinking property by giving it a crosslinked structure, by radiating ultraviolet rays simultaneously with a heat- treatment, thereby carrying out the crosslinking reaction at a low temperature. CONSTITUTION:After applying about 1mum thick positive-type radiation-responsive resist material with a crosslinking property, such as polymethacrylic acid or poly-n- butyl methacrylate, on a masking substrate with chrome film coated on the surface of a transparent glass substrate consisting of soda lime etc., a resist film having a crosslinked structure is formed, by giving a heat-treatment at 160 deg. for 60 minutes while radiating ultraviolet rays of 200-300nm wavelength on the other hand. This resist film is used for the exposure of an electron beam, an X-ray or the like. According to the above method, as the heat-treatment is performed at a low temperature, the diffusion of sodium in the glass substrate can be suppressed and a resist film having no pinholes can be obtained.
申请公布号 JPS55148423(A) 申请公布日期 1980.11.19
申请号 JP19790055590 申请日期 1979.05.07
申请人 CHO LSI GIJUTSU KENKYU KUMIAI 发明人 MIURA AKIRA;HIDEYAMA AKIZOU
分类号 H01L21/027;G03F1/00;G03F1/68;G03F1/80;G03F7/20;G03F7/40 主分类号 H01L21/027
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