发明名称 |
CMOS IMAGE SENSOR AND METHOD FOR MANUFACTURING HAVING THE SAME |
摘要 |
A CMOS image sensor and a method for manufacturing the same are provided to increase yield and quality by improving a lagging effect. A semiconductor substrate(200) includes a transistor element and a photodiode element. A pixel region and a non-pixel region are defined on the semiconductor substrate. An interlayer dielectric(210) is formed on an upper surface of the semiconductor substrate. The interlayer dielectric includes a SiH4 capping layer(212) formed on the pixel region of the semiconductor substrate and a USG layer(214) formed on the non-pixel region of the semiconductor substrate. A metal line(220) is formed on the interlayer dielectric. An insulating layer(230) for protecting elements is formed on the entire surface of the semiconductor substrate.
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申请公布号 |
KR100824625(B1) |
申请公布日期 |
2008.04.25 |
申请号 |
KR20060126060 |
申请日期 |
2006.12.12 |
申请人 |
DONGBU ELECTRONICS CO., LTD. |
发明人 |
KIM, JONG MAN |
分类号 |
H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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