发明名称 CMOS IMAGE SENSOR AND METHOD FOR MANUFACTURING HAVING THE SAME
摘要 A CMOS image sensor and a method for manufacturing the same are provided to increase yield and quality by improving a lagging effect. A semiconductor substrate(200) includes a transistor element and a photodiode element. A pixel region and a non-pixel region are defined on the semiconductor substrate. An interlayer dielectric(210) is formed on an upper surface of the semiconductor substrate. The interlayer dielectric includes a SiH4 capping layer(212) formed on the pixel region of the semiconductor substrate and a USG layer(214) formed on the non-pixel region of the semiconductor substrate. A metal line(220) is formed on the interlayer dielectric. An insulating layer(230) for protecting elements is formed on the entire surface of the semiconductor substrate.
申请公布号 KR100824625(B1) 申请公布日期 2008.04.25
申请号 KR20060126060 申请日期 2006.12.12
申请人 DONGBU ELECTRONICS CO., LTD. 发明人 KIM, JONG MAN
分类号 H01L27/146 主分类号 H01L27/146
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