发明名称 METHOD FOR FABRICATING OPTICAL PROXIMITY CORRECTION MASK
摘要 <p>A method for manufacturing OPC(Optical Proximity Correction) mask is provided to enhance process margin by using optimized OPC model considering step height. A method for manufacturing optical proximity correction mask comprises the following steps: a step for inserting a test pattern for OPC model; a step for extracting a pattern size(CD) in the test pattern for the OPC model; a step for setting up each OPC model with a set up file after generating each OPC set up file considering the pattern size; a step for manufacturing a mask by performing OPC with each OPC model; a step for detecting gap generation region with CMP(Chemical Mechanical Polishing) simulation result map; and a step for applying the OPC model to detected region.</p>
申请公布号 KR100880234(B1) 申请公布日期 2009.01.28
申请号 KR20070099298 申请日期 2007.10.02
申请人 DONGBU HITEK CO., LTD. 发明人 JEON, YOUNG DOO
分类号 H01L21/027;H01L21/66 主分类号 H01L21/027
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