发明名称 PATTERN SELECTIVE SCANNER
摘要 PURPOSE:To position always the electron beam to a prescribed position on a pattern accurately by deflecting the electron beam in not only the main scanning direction but also the subscanning direction and by repeating deflection scanning until a mark is detected. CONSTITUTION:The position designation command to read specific information in the pattern is coded by position designating circuits 29 and 30 respectively, and these signals are stored in shift registers 1 and 2. The pulse signal from oscillator 31 is sent to register 11 successively, and the number of pulses is added cumulatively and is added to the output of register 1 through adder 3, and the increment signal is applied to horizontal deflecting circuit 17 to deflect the electron beam in the X direction. The signal obtained by dividing the output of oscillator 31 by frequency divider 32 is subjected to D/A conversion in 6 through shift register 28 and adder 26 and is given to vertical deflecting circuit 18 simultaneously with the Y-direction deflection signal. Thus, the electron beam is deflected gradually in the Y direction. Deflection scanning for line and column mark position detection is repeated in this manner, thereby positioning correspondingly to designation information.
申请公布号 JPS55140370(A) 申请公布日期 1980.11.01
申请号 JP19790048859 申请日期 1979.04.20
申请人 RICOH KK 发明人 SHIBATA ISAMU
分类号 G06K7/016;G09G5/24;H04N3/22 主分类号 G06K7/016
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