发明名称 SURGE PREVENTIVE CIRCUIT FOR BIPOLAR INTEGRATED CIRCUIT
摘要 PURPOSE:To protect the pn-junction of an internal circuit in a bipolar integrated circuit against damage and deterioration thereof by forming the surge preventive circuit integral with a semiconductor substrate having the internal circuit and lowering the voltage when the surge voltage is applied thereto. CONSTITUTION:A grounding electrode 28 is coated on the back surface of a p<+>- type silicon substrate 1, and two n<+>-type buried regions 17, 26 are diffused on the surface thereof. Then, an n-type layer 2 is epitaxially grown on the entire surface including these regions, isolated into island state by a plurality of p<+>-type regions 3 reaching the substrate 1, the portion (a) having no buried regions of the isolated layer 2 and the portion (b) having the region 17 are used for the surge preventive circuit, and the region (c) having the region 26 is used for the internal circuit. Thereafter, p-type resistive regions 4, 9 are diffused in the portions (a) and (b), respectively, and a p-type base region 18 and an n<+>-type emitter region 23 disposed therein are formed normally in the portion (c). Then, electrode wiring is executed, and the portion (c) is protected by the portions (a) and (b).
申请公布号 JPS55140263(A) 申请公布日期 1980.11.01
申请号 JP19790048611 申请日期 1979.04.19
申请人 MITSUBISHI ELECTRIC CORP 发明人 SHINOMIYA KOUJI;ISHIKAWA HITOSHI;HAYAMIZU KOUICHI
分类号 H01L27/06;H01L21/331;H01L27/02;H01L29/73 主分类号 H01L27/06
代理机构 代理人
主权项
地址