发明名称 Semiconductor device subjected to heat treatment in reactor - has double walls with purging gas flowing through cavity entraining impurities
摘要 <p>The semiconductor device, is processed by subjecting it to an increased temperature, and is placed in a reactor inside a heating chamber. The reactor has a double wall. The cavity between the two walls in flushed with a gas during the treatment so that it, will entrain any impurity in the cavity. The reactor (20) is made from quartz, polysilicon or silicon carbide. The gas contains a halogeneous acid such as hydrogen chloride. The halogeneous acid is conveyed by a carrier gas such as oxygen. The temp. to which the semiconductor component is raised is up to 1050 deg.C.</p>
申请公布号 NL7903198(A) 申请公布日期 1980.10.28
申请号 NL19790003198 申请日期 1979.04.24
申请人 N.V. PHILIPS' GLOEILAMPENFABRIEKEN TE EINDHOVEN. 发明人
分类号 C30B31/10;C30B33/00;(IPC1-7):01L21/324 主分类号 C30B31/10
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