发明名称 METHOD FOR FIXING POWDER SAMPLE TO BE OBSERVED WITH ELECTRON MICROSCOPE, POWDER SAMPLE FIXING FILM, METHOD FOR OBSERVING POWDER SAMPLE, AND METHOD FOR ANALYZING POWDER SAMPLE
摘要 PROBLEM TO BE SOLVED: To provide a method for fixing a powder sample to be observed with an electron microscope, in which the sample is kept in a fixed state when it is vacuum-drawn and is not contaminated with an organic solvent.SOLUTION: There is provided a method for fixing a powder sample to be observed with an electron microscope, in which the powder sample is fixed with a powder sample fixing film 10 having more than one hollow 14 in one main surface 1 of the film. Pressing the powder sample against the main surface 11 of the powder sample fixing film 10 causes primary particles 15 forming secondary particles of the powder sample to be filled into their corresponding hollows 14, and this makes the powder sample to be fixed.SELECTED DRAWING: Figure 4
申请公布号 JP2016125975(A) 申请公布日期 2016.07.11
申请号 JP20150002041 申请日期 2015.01.08
申请人 SUMITOMO METAL MINING CO LTD 发明人 TAKAHASHI SATORU
分类号 G01N1/28;G01N23/225;H01J37/20 主分类号 G01N1/28
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