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发明名称
IC TEST UNIT
摘要
申请公布号
JPS55135762(A)
申请公布日期
1980.10.22
申请号
JP19790043774
申请日期
1979.04.11
申请人
TAKEDA RIKEN IND CO LTD
发明人
NISHIURA JIYUNJI
分类号
G01R31/28;G01R31/26;G01R31/3183;G01R31/319
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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