发明名称 VARIABLE CAPACITY DIODE AND METHOD OF FABRICATING THE SAME
摘要 PURPOSE:To reduce the irregularity of impurity distribution on a variable diode and minimize the characteristic irregularity thereof by employing an arsenic as first n- type impurity and using the arsenic for the main component of the shallow portion of n-type impurity distribution. CONSTITUTION:An n-type region is formed with two types of n-type impurities. In the shallow portion of the n-type region are existed a first n-type impurity having low diffusion coefficient such as, for example, an arsenic as a main component, and a second n-type impurity having high diffusion coefficient such as, for example, phosphorus as sub component. Further, in the deep region the depth thereof is increased, and the first n-type impurity amount is gradually reduced, and the second n-type impurity finally occupies 100% of n-type impurity.
申请公布号 JPS55133578(A) 申请公布日期 1980.10.17
申请号 JP19790040610 申请日期 1979.04.03
申请人 MATSUSHITA ELECTRONICS CORP 发明人 TOOI ATSUTOMO
分类号 H01L29/93;(IPC1-7):01L29/93 主分类号 H01L29/93
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