| 摘要 |
The invention concerns a test instrument, primarily designed for checking of the wire laying in a troubleshooting object, for example, an electrical or electronic circuit connection. Such a circuit connection can consist, for example, of a wired circuit card, where the wire laying is very complex and tangled. Yet the test instrument can also be used for measurement of logic levels in digital electronics, for example. The invention comprises primarily indication elements such as loudspeaker and monitor lights and an electronic measuring section. The measuring section is provided with two test connections for connecting of test cables by which a constant current is supplied to the troubleshooting object, which produces a voltage drop between the test connections. This voltage drop is detected by the measuring section and compared with a reference value. If the detected potential difference is less than or greater than the reference value, the indication element arranged in the measurement section puts out an acoustical and/or optical signal. <IMAGE> |
